Transconductance Degradation in Thin-Oxide MOSFET's

IEEE Transactions on Electron Devices

Volumn 30, Issue 10, 1983, Pages 1295-1304

  Baccarani, Giorgio ^a,b   Wordeman, Matthew R ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSCONDUCTANCE DEGRADATION;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0020831950     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1983.21290     Document Type: Article

References (23)

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