Effects of Hot-Carrier Trapping in n- and p-Channel Mosfet's

IEEE Transactions on Electron Devices

Volumn 30, Issue 8, 1983, Pages 871-876

  Ng, Kwok K ^a   Taylor, Geoffrey W ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0020797242     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1983.21229     Document Type: Article

References (42)

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