NEW HOT-CARRIER INJECTION AND DEVICE DEGRADATION IN SUBMICRON MOSFETs.

IEE Proceedings I: Solid State and Electron Devices

Volumn 130, Issue 3, 1983, Pages 144-150

  Takeda, Eiji ^a   Nakagome, Yoshinobu ^a   Kume, Hitoshi ^a   Asai, Shojiro ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

MOSFET;

TRANSISTORS, FIELD EFFECT;

EID: 0020767087     PISSN: 01437100     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-i-1.1983.0026     Document Type: Article

References (18)