Automatic Signature Verification Using a Three-Axis Force-Sensitive Pen

IEEE Transactions on Systems, Man and Cybernetics

Volumn SMC-13, Issue 3, 1983, Pages 329-337

  Crane, Hewitt D ^a   Ostrem, John S ^a,b  

^a SRI INTERNATIONAL   (United States)

^b SRI International ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SYSTEMS SCIENCE AND CYBERNETICS;

EID: 0020749235     PISSN: 00189472     EISSN: 21682909     Source Type: Journal    
DOI: 10.1109/TSMC.1983.6313165     Document Type: Article

References (12)

1. D. B. Parker, Crime by Computer. New York: Scribner's, 1976.
2. H. D. Crane, D. E. Wolf, and J. S. Ostrem, “The SRI pen system for automatic signature verification,” in Symp. Proc. NBS Trends and Applicat. 1977, May 1977, pp. 32-39.
3. J. Sternberg, “Automatic signature verification using handwriting pressure,” 1975 Wescon Tech. Papers, paper 31/4, Sept. 1975.
4. N. M. Herbst and C. N. Lin, “Automatic verification of signatures by means of acceleration patterns,” in Proc. IEEE Comp. Soc. Conf. Pattern Recognition and Image Processing, June 1977, pp. 331-336.
5. C. N. Lin, N. M. Herbst, and N. J. Anthony, “Automatic signature verification: System description and field test results,” IEEE Trans. Syst. Man, Cybern., vol. SMC-9, no. 1, pp. 35-38, Jan. 1979.
6. H. D. Crane and R. E. Savoie, “An on-line data entry system for hand-printed characters,” Comput. Mag., vol. 10, no. 3, pp. 43-50, Mar. 1977.
7. R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis. New York: Wiley, 1973, p. 66. Under certain assumptions concerning the probability distributions of the feature set, it can be shown that the process of feature selection cannot reduce the type I/type II error rates. However, as a practical matter, an improvement in error-rate performance often results from feature selection.
8. The F-ratio technique for feature selection is described in many textbooks. For example, see W. J. Dixon and F. J. Massey, Introduction to Statistical Analysis, 3rd ed. New York: McGraw-Hill, 1969;
9. G. W. Snedecor and W. G. Cochran, Statistical Methods, 6th ed. Iowa: Iowa State University Press, 1967; and
10. D. E. Bailey, Probability and Statistics. New York: Wiley, 1971.
11. S. Kullback, Information Theory and Statistics. New York: Wiley, 1959.
12. T. M. Cover and J. M. van Campenhout, “On the possible orderings in the measurement selection problem,” IEEE Trans. Syst. Man, Cybern., vol. SMC-7, no. 9, pp. 657-661, Sept. 1977.