Effects of interface-potential nonuniformities on carrier transport across silicon grain boundaries

Journal of Applied Physics

Volumn 54, Issue 4, 1983, Pages 1976-1980

  Thomson, D J ^a   Card, H C ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON;

EID: 0020734407     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.332210     Document Type: Article

References (10)