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Volumn 54, Issue 3, 1983, Pages 1457-1460
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An electron spin resonance study of radiation-induced electrically active paramagnetic centers at the Si/SiO2 interface
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTOR DEVICES;
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EID: 0020718887
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.332171 Document Type: Article |
Times cited : (134)
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References (40)
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