Impact of Scaling on MOS Analog Performance

IEEE Journal of Solid-State Circuits

Volumn 18, Issue 1, 1983, Pages 106-114

  Wong, Stephen ^a   Andre, C ^a   Salama, T ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

INTEGRATED CIRCUITS, VLSI;

EID: 0020705925     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1983.1051906     Document Type: Article

References (26)

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