Many-beam calculation of reflection high energy electron diffraction (RHEED) intensities by the multi-slice method

Japanese Journal of Applied Physics

Volumn 22, Issue 1R, 1983, Pages 176-180

  Ichimiya, Ayahiko ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS;

EID: 0020589557     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.22.176     Document Type: Article

References (14)

1. J. F. Menadue 1972 Acta Crystallogr. A28 1.
2. S. Ino 1980 Jpn. J. Appl. Phys. 19 1277.
3. H. Bethe 1928 Ann. Phys. 87 55.
4. A. Howie and M. J. Whelan 1961 Proc. R. Soc. London A263 217.
5. J. M. Coelwy and A. F. Moodie 1947 Act Crystallogr. 10 609.
6. R. Collela 1972 Acta Crystallogr. A28 11.
7. A. R. Moon 1972 Z. Naturforsch. 27a 390.
8. H. Yoshioka 1957 J. Phys. Soc. Jpn. 12 618.
9. A. Howie 1966 Philos. Mag. 14 223.
10. A. Ichimiya 1969 Jpn. J. Appl. Phys. 8 518.
11. P. A. Doyle and P. S. Turner 1968 Acta Crystallogr. A24 390.
12. P. L. Sanger 1969 Acta Crystallogr. A25 694.
13. H. Hirono, K. Mihama and A. Ichimiya 1978 Inst. Phys. Conf. Ser. 41 167.
14. P. Goodman 1979 Acta Crystallogr. A27 140.