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Volumn 130, Issue 1, 1983, Pages 37-51
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Topographic quantification of non‐planar localized surfaces
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Author keywords
fractography; localized surface; non planar surface; profile analysis; quantitative microscopy; roughness index; surface modelling; Topography
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Indexed keywords
HISTOMETRY;
METHODOLOGY;
NONHUMAN;
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EID: 0020533550
PISSN: 00222720
EISSN: 13652818
Source Type: Journal
DOI: 10.1111/j.1365-2818.1983.tb04196.x Document Type: Article |
Times cited : (28)
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References (15)
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