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Journal of Applied Physics

Volumn 54, Issue 1, 1983, Pages 260-267

The effect of interfacial traps on the stability of insulated gate devices on InP

(2) Lile, D L a Taylor, M J a

a Naval Command (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING INDIUM COMPOUNDS;

INDIUM PHOSPHIDE;

TRANSISTORS, FIELD EFFECT;

EID: 0020497563 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.331695 Document Type: Article

Times cited : (72)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.