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Volumn , Issue , 1982, Pages 292-299
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ELECTROMIGRATION-INDUCED FAILURES IN VLSI INTERCONNECTS.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMIGRATION DAMAGE;
FAILURE RATE PREDICTIONS;
MEDIAN TIME TO FAILURE;
MICROSTRUCTURAL INHOMOGENEITIES;
RELIABILITY ASSURANCE;
VLSI INTERCONNECTION STATISTICS;
INTEGRATED CIRCUITS, VLSI;
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EID: 0020304389
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/irps.1982.361948 Document Type: Conference Paper |
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Times cited : (40)
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References (0)
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