메뉴 건너뛰기




Volumn 29, Issue 6, 1982, Pages 2049-2054

Effect of CMOS miniaturization on cosmic-ray-induced error rate

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COSMIC RAYS; DATA STORAGE, SEMICONDUCTOR - STORAGE DEVICES; LOGIC CIRCUITS; SATELLITES;

EID: 0020299959     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4336494     Document Type: Article
Times cited : (38)

References (10)
  • 3
    • 0019048875 scopus 로고
    • Electron mobility in inversion and accumulation layers on thermally oxidized silicon structures
    • C. S. Sun and J. D. Plummer, “Electron mobility in inversion and accumulation layers on thermally oxidized silicon structures,” IEEE Trans. Elect. Dev, ED-27, No. 8, 1497 (1980).
    • (1980) IEEE Trans. Elect. Dev , vol.27 ED , Issue.8 , pp. 1497
    • Sun, C.S.1    Plummer, J.D.2
  • 4
    • 84938449592 scopus 로고
    • SYSCAP II, System of Circuit Analysis Programs User Information Manual Publication 76070600C
    • April
    • SYSCAP II, System of Circuit Analysis Programs User Information Manual Publication 76070600C, Control Data Corporation (April 1978).
    • (1978) Control Data Corporation
  • 5
    • 0019707564 scopus 로고
    • Dynamics of charge collection from alpha-particle tracks in integrated circuits
    • Orlando, FL (April 7
    • C. M. Hsieh, P. C. Murley and P. R. O'Brien, “Dynamics of charge collection from alpha-particle tracks in integrated circuits,” Proc. of IEEE Int'l. Reliability Physics Symposium, pp. 38-42, Orlando, FL (April 7, 1981).
    • (1981) Proc. of IEEE Int'l. Reliability Physics Symposium , pp. 38-42
    • Hsieh, C.M.1    Murley, P.C.2    O'Brien, P.R.3
  • 6
    • 84937995134 scopus 로고
    • Cosmic-ray-induced errors in MOS devices
    • April
    • J. C. Pickel and J. T. Blandford, Jr., “Cosmic-ray-induced errors in MOS devices,” IEEE Trans. Nucl. Sci NS-26, No. 6, pp. 1006-1015 (April 1980).
    • (1980) IEEE Trans. Nucl. Sci , vol.26 NS , Issue.6 , pp. 1006-1015
    • Pickel, J.C.1    Blandford, J.T.2
  • 9
    • 0020091827 scopus 로고
    • Alpha-particle-induced field and enhanced collection of carriers
    • C. Hu, “Alpha-particle-induced field and enhanced collection of carriers,” IEEE Electron Dev. Letters, EDL-3, 31, (1982).
    • (1982) EEE Electron Dev. Letters , vol.3 EDL , pp. 31
    • Hu, C.1
  • 10
    • 84938443902 scopus 로고
    • Technical Memorandum RADC-TM-81-ES-03
    • E. A. Burke, Technical Memorandum RADC-TM-81-ES-03, (1981).
    • (1981)
    • Burke, E.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.