CURRENT LIMITATIONS OF THIN FILM CONDUCTORS.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1982, Pages 300-306

  Black, James R ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMBINED ELECTROMIGRATION AND TEMPERATURE GRADIENT LIMITS; ELECTROMIGRATION CURRENT DENSITY LIMITS; ELECTROMIGRATION IN THIN FILM CONDUCTORS; FAILURE MECHANISM IN SEMICONDUCTOR DEVICES; TEMPERATURE GRADIENT LIMITS;

ELECTRIC CONDUCTORS;

EID: 0020295977     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1982.361949     Document Type: Conference Paper

References (0)