Generation of oxide charge and interface states by ionizing radiation and by tunnel injection experiments

IEEE Transactions on Nuclear Science

Volumn 29, Issue 6, 1982, Pages 1471-1478

  Knoll, M ^a   BraUnig D ^a   Fahrner, W R ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

CAPACITORS;

EID: 0020293801     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4336389     Document Type: Article

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