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Volumn 29, Issue 12, 1982, Pages 1906-1911

Investigation of Transient Electronic Transport in GaAs Following High Energy Injection

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS - TRANSPORT PROPERTIES;

EID: 0020292188     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1982.21050     Document Type: Article
Times cited : (50)

References (12)
  • 1
    • 0015346006 scopus 로고
    • Electron dynamics in short-channel field-effect transistors
    • J. G. Ruch, “Electron dynamics in short-channel field-effect transistors,” IEEE Trans. Electron Devices, vol. ED-19, pp. 652–654, 1972.
    • (1972) IEEE Trans. Electron Devices , vol.ED-19 , pp. 652-654
    • Ruch, J.G.1
  • 2
    • 0017456166 scopus 로고
    • Transient and steady-state electron transport properties of GaAs and InP
    • T. J. Maloney and J. Frey, “Transient and steady-state electron transport properties of GaAs and InP,” J. Appl. Phys., vol. 48, p. 781, 1977.
    • (1977) J. Appl. Phys. , vol.48 , pp. 781
    • Maloney, T.J.1    Frey, J.2
  • 3
    • 0019621904 scopus 로고
    • Ballistic transport in a semiconductor with collisions
    • M. S. Shur, “Ballistic transport in a semiconductor with collisions,” IEEE Trans. Electron Devices, vol. ED-28, pp. 1120–1130, 1981.
    • (1981) IEEE Trans. Electron Devices , vol.ED-28 , pp. 1120-1130
    • Shur, M.S.1
  • 4
    • 0019354020 scopus 로고
    • Near ballistic electron transport in GaAs devices at 77 K
    • M. S. Shur and L. F. Eastman, “Near ballistic electron transport in GaAs devices at 77 K,” Solid-State Electron., vol. 24, pp. 11–18, 1981.
    • (1981) Solid-State Electron , vol.24 , pp. 11-18
    • Shur, M.S.1    Eastman, L.F.2
  • 6
    • 0019606502 scopus 로고
    • Ballistic electron transport in semiconductors
    • K. Hess, “Ballistic electron transport in semiconductors,” IEEE Trans. Electron Devices, vol. ED-28, pp. 937–940, 1981.
    • (1981) IEEE Trans. Electron Devices , vol.ED-28 , pp. 937-940
    • Hess, K.1
  • 7
    • 84939741527 scopus 로고
    • Modeling of carrier transport in the finite collision duration regime: Effects in submicron devices
    • D. K. Ferry, J. R. Barker, and C. Jacoboni, Eds., New York: Plenum
    • D. K. Ferry, “Modeling of carrier transport in the finite collision duration regime: Effects in submicron devices,” in Physics of Nonlinear Transport, D. K. Ferry, J. R. Barker, and C. Jacoboni, Eds., New York: Plenum, 1979.
    • (1979) Physics of Nonlinear Transport
    • Ferry, D.K.1
  • 8
    • 0000241888 scopus 로고
    • Band-structure dependent transport and impact ionization in GaAs
    • H. Shichijo and K. Hess, “Band-structure dependent transport and impact ionization in GaAs,” Phys. Rev. B, vol. 23, pp. 4197–4207, 1981.
    • (1981) Phys. Rev. B , vol.23 , pp. 4197-4207
    • Shichijo, H.1    Hess, K.2
  • 10
    • 0017553475 scopus 로고
    • Velocity-field characteristics of GaAs with [formula omitted] conduction band ordering
    • M. A. Littlejohn, J. R. Hauser, and T. H. Glisson, “Velocity-field characteristics of GaAs with [formula omitted] conduction band ordering,” J. Appl. Phys., vol. 48, pp. 4587–4590, 1977.
    • (1977) J. Appl. Phys. , vol.48 , pp. 4587-4590
    • Littlejohn, M.A.1    Hauser, J.R.2    Glisson, T.H.3
  • 11
    • 0019007728 scopus 로고
    • Polar mode scattering in ballistic transport GaAs devices
    • T. J. Maloney, “Polar mode scattering in ballistic transport GaAs devices,” IEEE Electron Device Lett., vol. EDL-1, p. 54, 1980.
    • (1980) IEEE Electron Device Lett , vol.EDL-1 , pp. 54
    • Maloney, T.J.1
  • 12
    • 84939701074 scopus 로고
    • Noise and diffusion of hot carriers
    • D. K. Ferry, J. R. Barker, and C. Jacoboni, Eds., New York: Plenum
    • J. P. Nougier, “Noise and diffusion of hot carriers,” in Physics of Nonlinear Transport, D. K. Ferry, J. R. Barker, and C. Jacoboni, Eds., New York: Plenum, 1979, p. 425.
    • (1979) Physics of Nonlinear Transport , pp. 425
    • Nougier, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.