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Volumn 334, Issue , 1982, Pages 37-43

Proximity effects and influences of nonuniform illumination in projection lithography

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATIONS; MASKING GUIDELINES; NON-UNIFORM CONDENSER APERTURE ILLUMINATION; NONUNIFORM SOURCE; OPTICAL LITHOGRAPHY; PROXIMITY EFFECTS;

EID: 0020270194     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.933558     Document Type: Conference Paper
Times cited : (27)

References (8)
  • 1
    • 0017958203 scopus 로고
    • Performance Characteristics of Diazo-Type Photoresists Under e-Beam and Optical Exposure
    • April
    • J.M. Shaw and M. Hatzakis, “Performance Characteristics of Diazo-Type Photoresists Under e-Beam and Optical Exposure, ” Trans, of IEEE an Electron Devices, Vol. ED-25, No. 4, pp. 425-430, April 1978.
    • (1978) Trans, of IEEE an Electron Devices , vol.ED-25 , Issue.4 , pp. 425-430
    • Shaw, J.M.1    Hatzakis, M.2
  • 2
    • 0018457024 scopus 로고
    • A General Simulator for VLSI Lithography and Etching Processes: Part I - Application to Projection Lithography
    • April
    • W. G. Oldham, S. Nangaonkar, A. R. Neureuther, and M. M. O’Toole, “A General Simulator for VLSI Lithography and Etching Processes: Part I - Application to Projection Lithography, ” IEEE TYtms. on Electron Devices, Vol. ED-26, No. 4, pp. 717-722 April 1979.
    • (1979) IEEE Tytms. On Electron Devices , vol.ED-26 , Issue.4 , pp. 717-722
    • Oldham, W.G.1    Nangaonkar, S.2    Neureuther, A.R.3    O’ Toole, M.M.4
  • 3
    • 84957512255 scopus 로고
    • Proximity Effects in Projection Lithography: A Case Study of the Perkin-Elmer’Micralign’
    • June
    • P. D. Robertson, “Proximity Effects in Projection Lithography: A Case Study of the Perkin-Elmer’Micralign’, ” MS Thesis, University of California Berkeley, June 1981.
    • (1981) MS Thesis, University of California Berkeley
    • Robertson, P.D.1
  • 4
    • 84948061301 scopus 로고
    • Two-point Resolution in Partially Coherent Light II. Ordinary Microscopy, Annular Source
    • M. De and A. Basuray, “Two-point Resolution in Partially Coherent Light II. Ordinary Microscopy, Annular Source, ” Optica fata, Vol. 19, pp. 523, 1972.
    • (1972) Optica Fata , vol.19 , pp. 523
    • De, M.1    Basuray, A.2
  • 5
    • 3943085107 scopus 로고
    • The Effect of Condenser Obstruction on the Two-point Resolution of a Microscope
    • T. S. McKechnie, “The Effect of Condenser Obstruction on the Two-point Resolution of a Microscope” Optica Acta, Vol. 19, pp. 729, 1972.
    • (1972) Optica Acta , vol.19 , pp. 729
    • Mc Kechnie, T.S.1
  • 6
    • 84950617046 scopus 로고
    • Imaging with Sources of Non-uniform Distribution
    • A. Basuray and P. Mukherjee, “Imaging with Sources of Non-uniform Distribution, ” Optica Acta, Vol 24 pp. Bl, 1977.
    • (1977) Optica Acta , vol.24 , pp. B1
    • Basuray, A.1    Mukherjee, P.2
  • 7
    • 0017002413 scopus 로고
    • Image of a Periodic Complex Object in an Optical System under Partially Coherent Illumination
    • September
    • L. M. icmoxa and I. Suzuki, “Image of a Periodic Complex Object in an Optical System under Partially Coherent Illumination, ” J. Opt. Soc. Am, Vol. 66, No. 9, pp. 921, September 1976.
    • (1976) J. Opt. Soc. Am , vol.66 , Issue.9 , pp. 921
    • Icmoxa, L.M.1    Suzuki, I.2
  • 8
    • 84957518859 scopus 로고
    • Lens Aberrations and Nonuniform Illumination in Projection Lithography
    • December
    • F.W. Wise, “Lens Aberrations and Nonuniform Illumination in Projection Lithography, ” M. S. Thesis, University of California, Berkeley, December 1981.
    • (1981) M. S. Thesis, University of California, Berkeley
    • Wise, F.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.