SELF-TESTING OF MULTICHIP LOGIC MODULES.

Digest of Papers - International Test Conference

Volumn , Issue , 1982, Pages 200-204

  Bardell, Paul H ^a   McAnney, William H ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

LEVEL-SENSITIVE SCAN DESIGN; LSSD SELF-TEST; MISR/PARALLEL SRSG; RANDOM TEST SOCKET; RANDOM TESTING;

LOGIC DESIGN;

EID: 0020259648     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)