VARIATION OF LSSD AND ITS IMPLICATIONS ON DESIGN AND TEST PATTERN GENERATION IN VLSI.

Digest of Papers - International Test Conference

Volumn , Issue , 1982, Pages 63-66

  DasGupta, S ^a   Goel, P ^a   Walther, R G ^a   Williams, T W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; LEVEL SENSITIVE SCAN DESIGN; SHIFT REGISTER LATCH DESIGN;

LOGIC DESIGN;

EID: 0020259076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)