X-RAY SPECTROMETER BY ALUMINUM THERMOMIGRATION.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1982, Pages 312-315

  Alcorn, G E ^a   Kost, K A ^a   Marshall, F E ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM THERMOMIGRATION; LOW-LEAKAGE DETECTORS; REVERSE BREAKDOWNS; SYSTEM NOISE; X-RAY ARRAY; X-RAY DETECTOR;

SPECTROMETERS, X-RAY;

EID: 0020243184     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1982.190282     Document Type: Conference Paper

References (0)