On the analysis of diffusion length measurements by SEM

Solid State Electronics

Volumn 25, Issue 11, 1982, Pages 1077-1081

  Donolato, C ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES, ELECTRON - APPLICATIONS;

SEMICONDUCTOR MATERIALS;

EID: 0020205160     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(82)90144-7     Document Type: Article

References (20)

1. Analysis of EBIC considering the generation distribution of minority carriers
2. Electron penetration and energy transfer in solid targets