RADIATION HARDENED 256 multiplied by 4 BULK CMOS RAM.

R.C.A. Review

Volumn 43, Issue 3, 1982, Pages 458-463

  Napoli, L S ^a   Smeltzer, R K ^a   Donnelly, R ^a   Yeh, J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR;

EID: 0020178704     PISSN: 00336831     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)