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Journal of Applied Physics

Volumn 53, Issue 8, 1982, Pages 5720-5732

Defect production and lifetime control in electron and γ-irradiated silicon

(2) Brotherton, S D a Bradley, P a

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; SEMICONDUCTOR DIODES;

SEMICONDUCTING SILICON;

EID: 0020169807 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.331460 Document Type: Article

Times cited : (307)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.