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Journal of Applied Physics

Volumn 53, Issue 7, 1982, Pages 5052-5056

On tunneling in metal-oxide-silicon structures

(1) Weinberg, Z A a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

EID: 0020163706 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.331336 Document Type: Article

Times cited : (489)

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19
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.