A Statistical Failure/Load Relationship: Results of a Multicomputer Study

IEEE Transactions on Computers

Volumn C-31, Issue 7, 1982, Pages 697-706

  Iyer, Ravishankar K ^a   Butner, Steven E ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Computer failure data; performance reliability models; statistical failure models

Indexed keywords

COMPUTER SYSTEMS, DIGITAL;

EID: 0020153888     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1982.1676070     Document Type: Article

References (19)

1. Barr, Goodnight, Sall, and Hellwig, A User's Guide to SAS '76. Raleigh, NC: SAS Institute, 1976.
2. M. D. Beaudry, “Performance considerations for the reliability analysis of computing systems,” Ph.D. dissertation, Stanford Univ., Stanford, CA, 1978.
3. M. D. Beaudry, “Performance considerations for reliability analysis: A statistical case study,” Cen. for Reliable Comput., Comput. Sys. Lab., Stanford Univ., Stanford, CA, Tech. Rep. 126, May 1978.
4. S. E. Butner and R. K. Iyer, “A statistical study of reliability and system load at SLAC,” Cen. for Reliable Comput., Comput. Syst. Lab., Stanford Univ., Stanford, CA, Tech. Rep. 188, Jan. 1980.
5. X. Castillo and D. P. Siewiorek, “A performance-reliability model for computing systems,” in Proc. 10th Annu. Fault-Tolerant Comput. Symp., Oct. 1980, pp. 187–192.
6. X. Castillo and D. P. Siewiorek, “Workload, performance, and reliability of digital computing systems,” in Proc. 11th Int. Symp. on Fault-Tolerant Comput., June 1981, pp. 84–89.
7. N. Draper and H. Smith, Applied Regression Analysis. New York: Wiley, 1966.
8. Introduction to Virtual Storage in System/370. Poughkeepsie, NY: IBM Corp., 1972.
9. R. K. Iyer, S. E. Butner, and E. J. McCluskey, “An exponential failure/load relationship: Results of a multi-computer statistical study,” Cen. for Reliable Comput., Comput. Syst. Lab., Stanford Univ., Stanford, CA, Tech. Rep. 214, July 1981.
10. S. R. McConnell, D. P. Siewiorek, and M. M. Tsao, “The measurement and analysis of transient errors in digital computing systems,” in Proc. 9th Annu. Int. Symp. on Fault-Tolerant Comput., June 1979, pp. 67–70.
11. J. F. Meyer, “On evaluating the performability of degradable computing systems,” in Dig. 8th Annu. Int. Symp. on Fault-Tolerant Comput., June 1978, pp. 44–49.
12. J. F. Meyer, “On evaluating the performability of degradable computing systems,” IEEE Trans. Comput., vol. C-22, pp. 720–731, Aug. 1980.
13. J. D. Musa, “The measurement and management of software reliability,” Proc. IEEE, vol. 68, pp. 1131–1143, Sept. 1980.
14. G. J. Myers, Advances in Computer Architecture. New York: Wiley, 1978.
15. WYLBUR/370 Reference Manual SCIP. Stanford, CA: Stanford University, 1975.
16. ORVYL/370 Reference Manual SCIP. Stanford, CA: Stanford University, 1975.
17. J. J. Shedletsky and E. J. McCluskey, “The error latency of a fault in a combinational digital circuit,” in Dig. 5th Annu. Int. Conf. on Fault-Tolerant Comput., June 1973.
18. M. L. Shooman, Probabilistic Reliability—An Engineering Approach. New York: McGraw-Hill, 1968.
19. M. S. Younger, A Handbook for Linear Regression. Belmont, CA: Wadsworth, 1979.