Concurrent Error Detection in alu's by Recomputing with Shifted Operands

IEEE Transactions on Computers

Volumn C-31, Issue 7, 1982, Pages 589-595

  Patel, Janak H ^a   Fung, Leona Y ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

ALU; bit sliced ALU; concurrent error detection; fault detection; time redundancy; VLSI circuits; VLSI faults

Indexed keywords

INTEGRATED CIRCUITS - VERY LARGE SCALE INTEGRATION;

LOGIC CIRCUITS;

EID: 0020152817     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1982.1676055     Document Type: Article

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