Weak Mutation Testing and Completeness of Test Sets

IEEE Transactions on Software Engineering

Volumn SE-8, Issue 4, 1982, Pages 371-379

  Howden, William E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Complete; effective; mutations; testing

Indexed keywords

COMPUTER PROGRAMMING;

EID: 0020152782     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.1982.235571     Document Type: Article

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