Hall measurement studies and an electrical conduction model of tin oxide ultrafine particle films

Journal of Applied Physics

Volumn 53, Issue 6, 1982, Pages 4448-4455

  Ogawa, Hisahito ^a   Nishikawa, Masahiro ^a   Abe, Atsushi ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; HALL EFFECT;

TIN COMPOUNDS;

EID: 0020139946     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.331230     Document Type: Article

References (18)