INTERFEROMETRIC OPTICAL METROLOGY: BASIC PRINCIPLES AND NEW SYSTEMS.

Laser focus with fiberoptic technology

Volumn 18, Issue 5, 1982, Pages 65-71

  Wyant, James C ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

LASERS - APPLICATIONS;

INTERFEROMETRIC OPTICAL METROLOGY;

INTERFEROMETRY;

EID: 0020133159     PISSN: 02751399     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)