Sputtering analysis with PIXE

IEEE Transactions on Nuclear Science

Volumn 30, Issue 2, 1983, Pages 1285-1290

  Lambert, J M ^a   Vozzo, F R ^b   Trbojevic, D ^a   Allas, R G ^b   Knudson, A R ^b   Reynolds, G W ^b  

^a GEORGETOWN UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SPUTTERING;

EID: 0020113797     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4332511     Document Type: Article

References (9)

1. J. K. Hirvonen, (ed), Treatise on Materials Science and Technology, (Academic Press, New York, 1980).
2. G. W. Reynolds, A.R. Knudson and C.R. Gossett, Nucl. Instr. and Meth. 182/183, (1981) 197.
3. R. G. Allas, A.R. Knudson, J.M. Lambert, P.A. Treado and G.W. Reynolds, Nucl. Instr. and Meth. 194, (1982) 615.
4. H. H. Anderson and H.L. Bay, Sputtering by Ion Bombardment. (R. Behrisch, ed., Springer-Verlag, Verlag, Berlin, 1980).
5. P. Sigmund, Sputtering by Ion Bombardment, (R. Behrisch, ed., Springer-Verlag, Berlin, 1980).
6. J. F. Ziegler, (ed.), Helium: Stopping Powers and Ranges in All Elemental Matter, (Pergamon Press, New York, 1977).
7. R. K. Gardner and Tom J. Gray, Atomic Data and Nuclear Data Tables 21,(1978) 515.
8. C. G. Soares, R.D. Lear, J.T. Sanders and H.A. Van Rinsvelt, Phys. Rev. A13,(1976) 953.
9. S. Shafroth, et al., Phys. Rev. A7,(1973) 566.