Dynamic Testing of Waveform Recorders

IEEE Transactions on Instrumentation and Measurement

Volumn 32, Issue 1, 1983, Pages 12-17

  Peetz, Bruce E ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

WAVEFORM ANALYSIS;

EID: 0020099734     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1983.4315001     Document Type: Article

References (5)

1. D J. Packard, “Beat frequency testing of real time A/D converters,” presented at the Workshop on High Speed A/D Conversion, Portland, OR, Feb. 1980.
2. H. U. Koller, “New criterion for testing analog-to-digital converters for statistical evaluation,” IEEE Trans. Instrum. Meas., vol IM-22, pp 214-217, Sept. 1973.
3. R. Potter, “Least-squares estimation of sinusoidal parameters from measured data,” Hewlett-Packard Internal Memo, June 1974.
4. L. Ochs, “Measurement and enhancement of waveform digitizer performance,” presented at the IEEE Int. Convention, Boston, MA, May 1976.
5. R. N. Bracewell, The Fourier Transform and Its Applications. New York: McGraw-Hill, 1965.