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Volumn 18, Issue 6, 1982, Pages 274-275
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Three-dimensional simulation of inverse narrow-channel effect
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Author keywords
Semiconductor devices and materials; Simulation
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Indexed keywords
MOSFET;
TRANSISTORS, FIELD EFFECT;
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EID: 0020098984
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19820187 Document Type: Article |
Times cited : (30)
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References (3)
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