VLSI Parasitic Capacitance Determination by Flux Tubes

IEEE Circuits & Systems Magazine

Volumn 4, Issue 1, 1982, Pages 11-18

  Dierking, W H ^a   Bastian, J D ^a  

^a Rockwell International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS;

EID: 0020098874     PISSN: 01636812     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCAS.1982.6323835     Document Type: Article

References (3)

1. S. Ramo and J. R. Whinnery, Fields and Waves in Modern Radio, NY: John Wiley and Sons, Inc., Chap. 3; seventh printing, 1964.
2. W. H. Hayt, Engineering Electromagnetics, McGraw-Hill, Chap. 6, 1958.
3. Reference Data for Radio Engineers,NY: Stratford Press Incorporated, p. 134, fourth printing, 1957.