BEHAVIOR OF TRANSITION AND NOBLE METALS IN SILICON CRYSTALS.

Proceedings - The Electrochemical Society

Volumn 81-5, Issue , 1981, Pages 331-343

  Graff, K ^a   Pieper, H ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CONCENTRATION; ELECTRICALLY ACTIVE DEFECTS DETECTION; HAZE FORMATION; NOBLE METALS; SOLUBILITY AND DIFFUSION COEFFICIENTS OF THE 3RD TRANSITION METALS; TRANSIENT CAPACITY METHOD (DLTS); TRANSITION METALS;

SEMICONDUCTING SILICON;

EID: 0019703133     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)