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Volumn , Issue , 1981, Pages 102-109
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VLSI SELF-TESTING BASED ON SYNDROME TECHNIQUES.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ARCHITECTURE;
IC TESTING;
LSI;
MACROS;
SELF-TESTING;
SYNDROME TECHNIQUES;
VLSI;
WEIGTED SYNDROMES;
INTEGRATED CIRCUITS;
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EID: 0019684801
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (5)
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References (0)
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