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Volumn , Issue , 1981, Pages 110-113
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HARDWARE TEST PATTERN GENERATION FOR BUILT-IN TESTING.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
BUILT-IN TESTING;
COMBINATORIAL CIRCUITS;
FEEDBACK GENERATORS;
GENERATOR SYNTHESIS;
HARDWARE TESTING;
PATTERN GENERATION;
SHIFT REGISTERS;
TEST PATTERNS;
LOGIC CIRCUITS, COMBINATORIAL;
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EID: 0019666474
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (56)
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References (0)
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