ELECTRON TRAPPING IN VERY THIN THERMAL SILICON DIOXIDES.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1981, Pages 396-399

  Liang, Mong Song ^a   Hu, Chenming ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURE CROSS SECTIONS; CENTROIDS; ELECTRON TRAPPING; MATHEMATICAL MODEL; THERMALLY GROWN THIN SILICON DIOXIDE FILMS; TRAP DENSITIES; TRAP FILLING; TRAP GENERATION;

DEVICE IMPLICATIONS;

SILICA;

EID: 0019665266     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)