CMOS RAM cosmic-ray-induced-error-rate analysis

IEEE Transactions on Nuclear Science

Volumn 28, Issue 6, 1981, Pages 3962-3967

  Pickel, J C ^a   Blandford, J T ^b  

^a ROCKWELL SCIENCE CENTER   (United States)

^b Rockwell International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; RADIATION EFFECTS;

DATA STORAGE, DIGITAL;

EID: 0019661484     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1981.4335656     Document Type: Article

References (13)

1. D. Binder, E.C. Smith and A.B. Holman, “Satellite Anomalies from Galactic Cosmic Rays,” IEEE Trans. Nuc. Sci. NS-22, No. 6, December 1975, pp. 2675–2680.
2. J.C. Pickel and J.T. Blandford, Jr., “Cosmic Ray Induced Errors in MOS Memory Cells,” IEEE Trans. Nucl. Sci. NS-25, No. 6, December 1978, pp. 1166-1171.
3. W.A. Kolasinski, et al., “Simulation of Cosmic-Ray Induced Soft Errors and Latchup Integrated-Circuit Computer Memories,” IEEE Trans. Nucl. Sci. NS-26., No. 6, December 1979, pp. 5087–5091.
4. J.C. Pickel and J.T. Blandford, Jr., “Cosmic-Ray Induced Errors in MOS Devices,” IEEE Trans. Nucl. Sci. NS-27, No. 2, April 1980, pp.1006-1015.
5. C.S. Guenzer, et al., “Single Event Upsets in RAMS Induced by Protons at 4.2 GeV and Protons and Neutrons Below 100 Mev,” IEEE Trans. Nucl. Sci. NS-27, No. 6, December 1980, pp. 1485–1489.
6. J.T. Blandford, Jr. and J.C. Pickel, “TIROS-N Cosmic Ray Study Final Report,” Rockwell International Report No. C80-588/201, September 1981.
7. Private Communications, W.A. Kolasinski, Aerospace Corporation.
8. D.K. Nichols and W.E. Price, “An Investigation of Single Event Upsets vs Proton Energy of Bipolar and CMOS Static RAMS (Davis Test),” Jet Propulsion Lab Report No. 900–964, August 1980.
9. D.K. Nichols, et. al., “Investigation for Single Event Upset of Selective RAMS for IRAS. ISPM/Galileo (U.C. Berkeley),” Jet Propulsion Lab Report No. 900–984, March 1981.
10. W.A. Kolasinski, R. Koga and J.B. Blake, “Soft Error Susceptibility of a CMOS RAM: Dependence Upon Power Supply Voltage,” presented at 1981 IEEE Conference on Nuclear and Space Radiation Effects.
11. W.E. Price, et. al., “Investigation of Latchup Susceptibility for CD4000 CMOS Devices Used in DRIRU II (U.C. Berkeley),” Jet Propulsion Lab Report No. 900–976, January 1981.
12. W.E. Price, D.K. Nichols, and K.A. Soliman, “A Study of Single Event Upsets in Static RAMS,” IEEE Trans. Nucl. Sci. NS-27, No. 6, December 1980, pp. 1506–1508.
13. Private Communication, E.G. Stassinopoulos, NASA Goddard Space Flight Center.