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Volumn , Issue , 1981, Pages 204-209
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TIME-ZERO DIELECTRIC RELIABILITY TEST BY A RAMP METHOD.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
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EID: 0019656053
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/irps.1981.362997 Document Type: Conference Paper |
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Times cited : (156)
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References (7)
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