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Surface and Interface Analysis

Volumn 3, Issue 5, 1981, Pages 211-225

Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

(6) Wagner, C D a Davis, L E b Zeller, M V b Taylor, J A b Raymond, R H c Gale, L H c

a Surfex Company ^* (United States)

b PERKINELMER INC (United States)

c SHELL GLOBAL SOLUTIONS INTERNATIONAL B V (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SURFACES;

EID: 0019622512 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740030506 Document Type: Article

Times cited : (2029)

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9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.