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Volumn 28, Issue 9, 1981, Pages 1065-1070

Buried Channel GaAs MESFETʼns—Scattering Parameter and Linearity Dependence on the Channel Doping Profile

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING GALLIUM COMPOUNDS - DOPING;

EID: 0019614098     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1981.20486     Document Type: Article
Times cited : (8)

References (13)
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    • June
    • M. B. Das and P. Esqueda, “A two-layer microwave FET structure for improved characteristics,” IEEE Trans. Electron Devices, vol. ED-24, pp. 757–761, June 1977.
    • (1977) IEEE Trans. Electron Devices , vol.ED-24 , pp. 757-761
    • Das, M.B.1    Esqueda, P.2
  • 3
    • 0017971348 scopus 로고
    • Calculation of microwave performance of buffer layer gate MESFET's
    • May
    • A. Nagashima, S. Umebachi, and G. Kano, “Calculation of microwave performance of buffer layer gate MESFET's,” IEEE Trans. Electron Devices, vol. ED-25, pp. 537–539, May 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 537-539
    • Nagashima, A.1    Umebachi, S.2    Kano, G.3
  • 4
    • 0017981171 scopus 로고
    • Graded channel FET's: Improved linearity and noise figure
    • June
    • R. E. Williams and D. W. Shaw, “Graded channel FET's: Improved linearity and noise figure,” IEEE Trans. Electron Devices, vol. ED-25, 600–605, June 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 600-605
    • Williams, R.E.1    Shaw, D.W.2
  • 5
    • 0018442745 scopus 로고
    • Effect on an n-layer under the gate on the performance of InP MESFET's
    • Mar.
    • H. Morkog, J. T. Andrews, and S. B. Hyder, “Effect on an n-layer under the gate on the performance of InP MESFET's,” IEEE Trans. Electron Devices, vol. ED-26, pp. 238–240, Mar. 1979.
    • (1979) IEEE Trans. Electron Devices , vol.ED-26 , pp. 238-240
    • Morkog, H.1    Andrews, J.T.2    Hyder, S.B.3
  • 6
    • 0019022457 scopus 로고
    • Modeling the influence of carrier profiles on MESFET characteristics
    • June
    • J. A. Higgins, “Modeling the influence of carrier profiles on MESFET characteristics,” IEEE Trans. Electron Devices, vol. ED-27, pp. 1066–1073, June 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , pp. 1066-1073
    • Higgins, J.A.1
  • 7
    • 0016100806 scopus 로고
    • Noise characteristics of gallium arsenide field-effect transistors
    • Sept.
    • H. Statz, H. Haus, and R. Pucel, “Noise characteristics of gallium arsenide field-effect transistors,” IEEE Trans. Electron Devices, vol. ED-21, pp. 549–562, Sept. 1974.
    • (1974) IEEE Trans. Electron Devices , vol.ED-21 , pp. 549-562
    • Statz, H.1    Haus, H.2    Pucel, R.3
  • 8
    • 84939059563 scopus 로고
    • U.S. Patent 3 693 055, priority date
    • U.S. Patent 3 693 055, priority date: Jan. 15, 1970.
    • (1970)
  • 9
    • 84939004798 scopus 로고    scopus 로고
    • Two-dimensional lateral transmission line MESFET model
    • to be published.
    • F. Ponse and J. J. M. Dekkers, “Two-dimensional lateral transmission line MESFET model,” to be published.
    • Ponse, F.1    Dekkers, J.J.M.2
  • 11
    • 84939003762 scopus 로고
    • Optimization of an ion implanted layer for GaAs FETʼns based on a numerical solution of the Poissionʼns equation for the layer
    • Darmstadt, presented at 6th European Specialist Workshop on Active Microwave Semiconductor Devices F.R.G.
    • M. Buiatti and F. Marcelia, “Optimization of an ion implanted layer for GaAs FET's based on a numerical solution of the Poission's equation for the layer,” presented at 6th European Specialist Workshop on Active Microwave Semiconductor Devices, 1980, Darmstadt, F.R.G.
    • (1980)
    • Buiatti, M.1    Marcelia, F.2
  • 12
    • 0017947811 scopus 로고
    • A small-signal analytical theory for GaAs FETʼns at large drain voltages
    • Mar.
    • J. Sone and Y. Takayama, “A small-signal analytical theory for GaAs FET's at large drain voltages,” IEEE Trans. Electron Devices, vol. ED-25, pp. 329–337, Mar. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 329-337
    • Sone, J.1    Takayama, Y.2
  • 13
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    • Analysis and improvement of intermodulation distortion in GaAs Power FET's
    • Jan.
    • J. A. Higgins and R. L. Kuvas, “Analysis and improvement of intermodulation distortion in GaAs Power FET's,” IEEE Trans. Microwave Theory Tech., vol. MTT-28, pp. 9–17, Jan. 1980.
    • (1980) IEEE Trans. Microwave Theory Tech. , vol.MTT-28 , pp. 9-17
    • Higgins, J.A.1    Kuvas, R.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.