Multiple Criterion Optimization with Yield Maximization

IEEE Transactions on Circuits and Systems

Volumn 28, Issue 8, 1981, Pages 781-791

  Lightner, Michael R ^a   Director, Stephen W ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - COMPUTER AIDED DESIGN;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0019606798     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1981.1085049     Document Type: Letter

References (18)

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3. P. W. Becker and F. Jensen, Design of Systems and Circuits for Maximum Production Yield. New York: McGraw-Hill, 1977.
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8. “Yield optimization for arbitrary statistical distributions- Part II: Implementation,” IEEE Trans. Circuits Syst., vol. CAS-27, Apr. 1980.
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