Analysis of Performance-Degradation Data from Accelerated Tests

IEEE Transactions on Reliability

Volumn R-30, Issue 2, 1981, Pages 149-155

  Nelson, Wayne ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

Author keywords

Accelerated tests; Arrhenius law; Data analysis; Product degradation

Indexed keywords

ELECTRIC INSULATION - TESTING;

RELIABILITY;

EID: 0019583484     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1981.5221010     Document Type: Article

References (5)

1. W. Nelson, “A survey of methods for planning and analysing accelerated tests,” IEEE Trans. Electrical Insulation, vol EI-9, 1974, pp 12-18.* Also, GE Corp. Res. and Devel. TIS Report 74CRD034.*
2. W.B. Nelson, “Analysis of performance degradation data from accelerated tests,” GE Corp. Res. & Devel. TIS Report 79CRD217.*
3. W.B. Nelson, C.B. Morgan, P. Caporal, “1979 STATPAC simplified—a short introduction to how to run STATPAC, a general statistical package for data analysis,” GE Co. Corp. Res. & Devel. TIS Report 78CRD276.* Available on license through the GE CRD Technology Marketing Operation; 120 Erie Blvd.; Schenectady, NY USA. Contact Mr. Keith Burke, phone 518-385-3801.
4. J. Neter, W. Wasserman, Applied Linear Statistical Models, Irwin, Homewood, IL, 1974.
5. L.C. Whitman, P. Doigan, “Calculation of life characteristics of insulation,” AIEE Trans., vol 73, 1954, pp 193–8.