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Volumn 53, Issue 7, 1981, Pages 1060-1064
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X-ray Microanalysis of Thin Crystals in the Electron Microscope and Its Application to Solid-State Chemistry
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Author keywords
[No Author keywords available]
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Indexed keywords
SOLID STATE CHEMISTRY;
CRYSTALS;
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EID: 0019574580
PISSN: 00032700
EISSN: 15206882
Source Type: Journal
DOI: 10.1021/ac00230a032 Document Type: Article |
Times cited : (66)
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References (12)
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