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Volumn 53, Issue 7, 1981, Pages 1060-1064

X-ray Microanalysis of Thin Crystals in the Electron Microscope and Its Application to Solid-State Chemistry

Author keywords

[No Author keywords available]

Indexed keywords

SOLID STATE CHEMISTRY;

EID: 0019574580     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00230a032     Document Type: Article
Times cited : (66)

References (12)
  • 3
    • 0016717822 scopus 로고
    • (Oxford) 1975, 103, 203-207. Goldstein, J. I. J. Met., 31(12)
    • Cliff, G.; Lorimer, G. W. J. Microsc. (Oxford) 1975, 103, 203-207. Goldstein, J. I. J. Met. 1979, 31(12), 66.
    • (1979) J. Microsc. , pp. 66
    • Cliff, G.1    Lorimer, G.W.2
  • 5
    • 85021592035 scopus 로고
    • D.Ph. Thesis, Oxford, England
    • Rae-Smith, A. R. D.Ph. Thesis, Oxford, England, 1980.
    • (1980)
    • Rae-Smith, A.R.1
  • 7
    • 85021555736 scopus 로고
    • McKinley, T. D., Heinrich, K. F. J., Wlttry, D. B., Eds.; Wiley: New York
    • Heinrich, K. F. J. In “The Electron Microprobe”; McKinley, T. D., Heinrich, K. F. J., Wlttry, D. B., Eds.; Wiley: New York, 1966; pp 350-377.
    • (1966) The Electron Microprobe , pp. 350-377
    • Heinrich, K.F.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.