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Volumn 14, Issue 6, 1981, Pages 649-671
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Electron interferometry and interference electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFEROMETRY;
MICROSCOPES, ELECTRON;
ELECTRON OPTICS;
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EID: 0019573186
PISSN: 00223735
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3735/14/6/001 Document Type: Review |
Times cited : (138)
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References (201)
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