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Volumn 65, Issue 2, 1981, Pages 649-658

An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers: I. Minority carrier generation, diffusion, and collection

(1) Donolato, C a

a CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS;

EID: 0019573105 PISSN: 00318965 EISSN: 1521396X Source Type: Journal
DOI: 10.1002/pssa.2210650231 Document Type: Article

Times cited : (122)

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