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Volumn 52, Issue 5, 1981, Pages 3491-3497

Positive and negative charging of thermally grown SiO2 induced by Fowler-Nordheim emission

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

EID: 0019561675     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.329126     Document Type: Article
Times cited : (54)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.