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Volumn 52, Issue 5, 1981, Pages 3491-3497
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Positive and negative charging of thermally grown SiO2 induced by Fowler-Nordheim emission
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTOR DEVICES, MOS;
SILICA;
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EID: 0019561675
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.329126 Document Type: Article |
Times cited : (54)
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References (25)
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