Threshold-Voltage Instability in MOSFET's Due to Channel Hot-Hole Emission

IEEE Transactions on Electron Devices

Volumn 28, Issue 1, 1981, Pages 83-94

  Fair, Richard B ^a   Sun, Robert C ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b Solid State Scientific ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0019476903     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1981.20287     Document Type: Article

References (42)

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