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Volumn 28, Issue 1, 1981, Pages 6-12

An All-Implanted CCD/CMOS Process

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0019439779     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1981.20275     Document Type: Article
Times cited : (9)

References (12)
  • 1
    • 0018434844 scopus 로고
    • Charge-coupled device (CCD) adaptive discrete analog signal processing
    • Feb.
    • M. White et al., “Charge-coupled device (CCD) adaptive discrete analog signal processing,” IEEE J. Solid-State Circuits, Vol. SC-14, pp. 132–147, Feb. 1979.
    • (1979) IEEE J. Solid-State Circuits , vol.SC-14 , pp. 132-147
    • White, M.1
  • 2
    • 0017537641 scopus 로고
    • A CMOS/buried-N-channel CCD compatible process for analog signal processing applications
    • Sept.
    • R. Dawson et al., “A CMOS/buried-N-channel CCD compatible process for analog signal processing applications,” RCA Rev., Vol. 38, pp. 406–435, Sept. 1977.
    • (1977) RCA Rev. , vol.38 , pp. 406-435
    • Dawson, R.1
  • 4
    • 0018031839 scopus 로고
    • The structure and composition of silicon oxides grown in HCl/O2 ambients
    • Nov.
    • J. Monkowski, R. Tressler, and J. Stach, “The structure and composition of silicon oxides grown in HCl/O 2 ambients,” J. Electrochem. chem. Soc., Vol. 125, pp. 1867–1873, Nov. 1978.
    • (1978) J. Electrochem. chem. Soc. , vol.125 , pp. 1867-1873
    • Monkowski, J.1    Tressler, R.2    Stach, J.3
  • 5
    • 0016470740 scopus 로고
    • Direct comparison of iondamage damage gettering and phosphorus-diffusion gettering of Au in Si
    • Feb.
    • T. Seidel, P. Meek, and A. Cullis, “Direct comparison of iondamage damage gettering and phosphorus-diffusion gettering of Au in Si,” J. Appl. Phys., Vol. 46, pp. 600–609, Feb. 1975.
    • (1975) J. Appl. Phys. , vol.46 , pp. 600-609
    • Seidel, T.1    Meek, P.2    Cullis, A.3
  • 6
    • 0018019352 scopus 로고
    • Rapid interpretation of the MOS-C C-t transient
    • Sept.
    • R. Pierret, “Rapid interpretation of the MOS-C C-t transient,” IEEE Trans. Electron Devices, Vol. ED-25, pp. 1157–1159, Sept. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 1157-1159
    • Pierret, R.1
  • 7
    • 84939056251 scopus 로고
    • Evaluation of low dark current charge-coupled devices
    • Sept. (Univ. of Edinburgh Edinburgh Scotland
    • G. Declerk et al., “Evaluation of low dark current charge-coupled devices,” in Proc. 3rd Int. Conl. on Tech. and Applic. of CCD (Univ. of Edinburgh, Edinburgh, Scotland), pp. 23–30, Sept. 1976.
    • (1976) Proc. 3rd Int. Conl. on Tech. and Applic. of CCD) , pp. 23-30
    • Declerk, G.1
  • 8
    • 0016536881 scopus 로고
    • Thermal carrier generation in charge-coupled coupled devices
    • Aug.
    • D. Ong and R. Pierret, “Thermal carrier generation in charge-coupled coupled devices,” IEEE Trans. Electron Devices, Vol. ED-22, pp. 593–602, Aug. 1975.
    • (1975) IEEE Trans. Electron Devices , vol.ED-22 , pp. 593-602
    • Ong, D.1    Pierret, R.2
  • 9
    • 0018054883 scopus 로고
    • High performance NMOS operational amplifier
    • Dec.
    • D. Senderwicz, D. Hodges, and P. Gray, “High performance NMOS operational amplifier,” IEEE J. Solid-State Circuits, Vol. SC-13, pp. 760–766, Dec. 1978.
    • (1978) IEEE J. Solid-State Circuits , vol.SC-13 , pp. 760-766
    • Senderwicz, D.1    Hodges, D.2    Gray, P.3
  • 10
    • 0016919686 scopus 로고
    • The design and operation of practical charge transfer transfer transversal filters
    • Feb.
    • R. Baertsch et al., “The design and operation of practical charge transfer transfer transversal filters,” IEEE J. Solid-State Circuits, Vol. SC-11, pp. 65–74, Feb. 1976.
    • (1976) IEEE J. Solid-State Circuits , vol.SC-11 , pp. 65-74
    • Baertsch, R.1
  • 11
    • 84939063070 scopus 로고
    • CONRIP, constrained ripple nonrecursive recursive digital filter design, userʼns manual and guide
    • Dec.75-42
    • B. Leon and M. McCallig, “CONRIP, constrained ripple nonrecursive recursive digital filter design, user's manual and guide,” Purdue University Tech. Rep. TR-EE 75–42, Dec. 1975.
    • (1975) Purdue University Tech. Rep. TR-EE
    • Leon, B.1    McCallig, M.2
  • 12
    • 0017677548 scopus 로고
    • Self-contained charge-coupled split-electrode filters using a novel sensing technique
    • Dec.
    • C. Sequin et al., “Self-contained charge-coupled split-electrode filters using a novel sensing technique,” IEEE J. Solid-State Circuits, Vol. SC-12, pp. 626–632, Dec. 1977.
    • (1977) IEEE J. Solid-State Circuits , vol.SC-12 , pp. 626-632
    • Sequin, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.