Analysis of field-effect-conductance measurements on amorphous semiconductors

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 43, Issue 1, 1981, Pages 93-103

  Powell, M J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON - AMORPHOUS;

SEMICONDUCTOR MATERIALS;

EID: 0019438060     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418638108225803     Document Type: Article

References (15)

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