SOFT ERROR IMPROVEMENT OF DYNAMIC RAM WITH Hi-C STRUCTURE.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1980, Pages 578-581

  Yamada, M ^a   Taniguchi, M ^a   Yoshihara, T ^a   Takano, S ^a   Matsumoto, H ^a   Nishimura, T ^a   Nakamo, T ^a   Gamou, Y ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR;

EID: 0019284209     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1980.189899     Document Type: Conference Paper

References (3)